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Robust Orientation Estimation Algorithm of Fingerprint Images  

Lee, Sang-Hoon (Biometrics Engineering Research Center, Yonsei Univ.)
Lee, Chul-Han (Biometrics Engineering Research Center, Yonsei Univ.)
Choi, Kyoung-Taek (Biometrics Engineering Research Center, Yonsei Univ.)
Kim, Jai-Hie (Biometrics Engineering Research Center, Yonsei Univ.)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SP / v.45, no.1, 2008 , pp. 55-63 More about this Journal
Abstract
Ridge orientations of fingerprint image are crucial informations in many parts of fingerprint recognition such as enhancement, matching and classification. Therefore it is essential to extract the ridge orientations of image accurately because it directly affects the performance of the system. The two main properties of ridge orientation are 1) global characteristic(gradual change in whole part of fingerprint) and 2) local characteristic(abrupt change around core and delta points). When we only consider the local characteristic, estimated ridge orientations are well around singular points but not robust to noise. When the global characteristic is only considered, to estimate ridge orientation is robust to noise but cannot represent the orientation around singular points. In this paper, we propose a novel method for estimating ridge orientation which represents local characteristic specifically as well as be robust to noise. We reduce the noise caused by scar using iterative outlier rejection. We apply adaptive measurement resolution in each fingerprint area to estimate the ridge orientation around singular points accurately. We evaluate the performance of proposed method using synthetic fingerprint and FVC 2002 DB. We compare the accuracy of ridge orientation. The performance of fingerprint authentication system is evaluated using FVC 2002 DB.
Keywords
fingerprint recognition; orientation estimation; synthetic fingerprint;
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