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Reliability Improvement of Automatic Basal Cell Carcinoma Classifier with an Ambiguous Pattern Class  

Park, Aa-Ron (The School of Electronic and Computer Engineering, Chonnam National University)
Baek, Seong-Joon (The School of Electronic and Computer Engineering, Chonnam National University)
Jung, In-Wook (The School of Electronic and Computer Engineering, Chonnam National University)
Song, Min-Gyu (The School of Electronic and Computer Engineering, Chonnam National University)
Na, Seung-Yu (The School of Electronic and Computer Engineering, Chonnam National University)
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Abstract
Raman spectroscopy is known to have strong potential for providing noninvasive dermatological diagnosis of skin cancer. According to the previous work, various well known methods including maximum a posteriori probability (MAP) and multilayer perceptron networks (MLP) showed competitive results. Since even the small errors often leads to a fatal result, we investigated the method that reduces classification error perfectly by screening out some ambiguous patterns. Those ambiguous patterns can be examined by routine biopsy. We incorporated an ambiguous pattern class in MAP, linear classifier using minimum squared error (MSE), MLP and reduced coulomb energy networks (RCE). The experiments involving 216 confocal Raman spectra showed that every methods could perfectly classify BCC by screening out some ambiguous patterns. The best results were obtained with MSE. According to the experimental results, MSE gives perfect classification by screening out 8.8% of test patterns.
Keywords
BCC; Raman spectroscopy;
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