Chip-level NFP Calibration and Verification Using Improved Probe for NFS Standardization |
Lee, Pil-Soo
(School of Electronics Engineering, Soongsil University)
Wee, Jae-Kyung (School of Electronics Engineering, Soongsil University) Kim, Boo-Gyoun (School of Electronics Engineering, Soongsil University) Choi, Jai-Hoon (SK hynix, memory R&D) Yeo, Soon-Il (ETRI) |
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