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Analysis of Electrical Features of Serially and Parallelly connected Memristor Circuits  

Budhathoki, Ram Kaji (Electronic and Information Engineering Faculty,Chonbuk National University)
Sah, Maheshwar Pd. (Electronic and Information Engineering Faculty,Chonbuk National University)
Kim, Ju-Hong (Electronic and Information Engineering Faculty,Chonbuk National University)
Kim, Hyong-Suk (Electronic and Information Engineering Faculty,Chonbuk National University)
Publication Information
Abstract
Memristor which is known as fourth basic circuit element has been developed recently but its electrical characteristics are not still fully understood. Memristor has the incremental and decremental feature of the resistance depending upon the connected polarities. Also, its operational behavior become diverse depending on its connection topologies. In this work, electrical characteristics of diverse types of serial and parallel connections are investigated using the HP $TiO_2$ model. The characteristics are analyzed with pinched hystersis loops on the V-I plane when sine input signal is applied. The results of the work would be utilized usefully for analyzing the characteristics of memristor element and applications to logic circuit and neuron cells.
Keywords
Memristor; series and parallel connections; incremental and decremental; pinched hysteresis loop;
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1 L. O. Chua, "Memristor-the missing circuit element," IEEE Trans. Circuit Theory, vol. CT-18, no. 5, pp. 507-519, Sep. 1971.
2 L. O. Chua and S. M Kang, "Memristive devices and systems," Proc. of IEEE, vol. 64, no. 2, pp. 209-223, Feb. 1976.   DOI
3 D. B. Strukov, G.S. Snider, D. R. Stewart and R. S. Williams, "The missing memristor found," Nature 453, pp. 80-83, 2008.   DOI   ScienceOn
4 Y. N. Joglekar and S. J. Wolf, "The elusive memristor: properties of basic electrical circuits, rXiv: 0807.3994v2 [cons-mat.mes-hall], Jan. 13, 2009.   DOI   ScienceOn
5 B. O. Kavehei, A. Iqbal, Y. S. Kim, K. Eshraghian, S. F. Al-sarawi,and D. Abboti, "The fourth element: Characteristics, modeling and electromagnetic theory of the memristor," 2010, arXiv: 1002.3210v1 [cond-mat.mes-hall].
6 S. Shin, K. Kim, and S. M. Kang, "Compact models for memristors based on charge-flux constitutive relationships," IEEE Trans. Comput.-AidedDes. Integr. Circuits Syst., vol. 29, no. 4, pp. 590-598, Apr. 2010.   DOI
7 E. M. Drakakis, S. N. Yaliraki, and M. Barahona, "Memristors and Bernoulli dynamics," in Proc. 2010 Int. Workshop on Cellular Nanoscale Networks and their Applications (CNNA), Feb. 2010, pp.70-75.
8 F. Y. Wang, "Memristor for introductory physics," 2008, arXiv: 0808.0286v1 [physics. Class-ph].
9 A. Rak and G. Cserey, "Macromodelling of the memristor in SPICE," IEEE Trans. Comput.- Aided Des. Integr. Circuits Syst., vol. 29, no. 4,pp. 632-636, Apr. 2010.   DOI
10 Y. V. Pershin and M. D. Ventra, "Practical approach to programmable analog circuits with memristors," IEEE Trans. Circuits Syst. I, Reg.Papers, vol. 57, no. 8, pp. 1857-1864, Aug. 2010.   DOI
11 J. Borghettil, G. S. Snider, P. J. Kuekes, J. J. Yang, D. R. Stewart, and R. S. Williams, "Memristive switches enable stateful logic operations via material implication," Nature Lett., vol. 464, no. 8, pp. 873-876,Apr. 2010.   DOI
12 Q. Xia, W. Robinett, M. W. Cumbie, N. Banerjee, T. J. Cardinali, J.J. Yang, W. Wu, X. Li, W. M. Tong, D. B. Strukov, G. S. Snider, G.Medeiros-Ribeiro, and R. S. Williams, "Memristor-CMOS hybrid integrated circuits for reconfigurable logic," Nano Lett., vol. 9, no. 10, pp. 3640-3645, Sep. 2009, DOI: 10.1021/nl901874j.   DOI   ScienceOn
13 I. Petras, "Fractional-order memristor-based Chua's circuit," IEEE Trans. Circuits Syst. II, Expr. Briefs, vol. 57, no. 12, pp. 975-979,Dec. 2010.   DOI
14 H. Kim, M.P. Sah, C. Yang, T. Roska, and L. O. Chua "Neural synaptic weighting with a pulse-based memristor circuit," IEEE Trans. on Circuit and Systems-I, vol. PP, issue 99, 2011.
15 H. Kim, M.P. Sah, C. Yang, T. Roska, and L. O. Chua "Memristor bridge synapses," (Accepted for publication and will appear in the Proceeding of IEEE.