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Accuracy Analysis of Substrate Model for Multi-Finger RF MOSFETs Using a New Parameter Extraction Method  

Choi, Min-Kwon (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Kim, Ju-Young (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Lee, Seong-Hearn (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.49, no.2, 2012 , pp. 9-14 More about this Journal
Abstract
In this study, multi-finger RF MOSFET substrate parameters are accurately extracted by using S-parameters measured from common source-bulk and common source-gate test structures. Using this extraction method, the accuracy of an asymmetrical model with three substrate resistances is verified by observing better agreement with measured Y-parameters than a simple model with a single substrate resistance. The modeled S-parameters of the asymmetrical model also show excellent agreement with measured ones up to 20GHz.
Keywords
RF CMOS; MOSFET; multi-finger; substrate model; substrate resistance; parameter extraction;
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