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An Efficient Design Technique for Concurrent Core Testing of AMBA-based SoC  

Song, Jae-Hoon (Transono)
Oh, Jung-Sub (Department of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Department of Computer Science & Engineering, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.48, no.2, 2011 , pp. 44-54 More about this Journal
Abstract
The goal of this paper is reducing the test time for AMBA-based SoC. To achieve this goal, the design technique that can test several cores concurrently by reusing AMBA as TAM is proposed. The additional control logic for structural parallel core test is minimized by reusing TIC which is originally used for functional test of AMBA. SoC reliability and test time reduction can be significantly achieved with the concurrent core test technique as well as functional test.
Keywords
SoC; AMBA; IEEE 1500; parallel test; scan test;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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