Investigation of Device Characteristics on the Mechanical Film Stress of Contact Etch Stop Layer in Nano-Scale CMOSFET
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Na, Min-Ki
(Department of Electronics Eng., Chungnam National University)
Han, In-Shik (Department of Electronics Eng., Chungnam National University) Choi, Won-Ho (Department of Electronics Eng., Chungnam National University) Kwon, Hyuk-Min (Department of Electronics Eng., Chungnam National University) Ji, Hee-Hwan (MagnaChip Semiconductor Ltd.) Park, Sung-Hyung (MagnaChip Semiconductor Ltd.) Lee, Ga-Won (Department of Electronics Eng., Chungnam National University) Lee, Hi-Deok (Department of Electronics Eng., Chungnam National University) |
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