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Built-In Redundancy Analysis Algorithm for Embedded Memory Built-In Self Repair with 2-D Redundancy  

Shim, Eun-Sung (Department of Computing, Soongsil University)
Chang, Hoon (Department of Computing, Soongsil University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.44, no.2, 2007 , pp. 113-120 More about this Journal
Abstract
With the advance of VLSI technology, the capacity and density of memories is rapidly growing. In this paper we proposed reallocation algorithm. All faulty cell of embedded memory is reallocated into the row and column spare memory. This work implements reallocation algorithm and BISR to verify its design.
Keywords
BIRA; BISR; Embedded Memory;
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