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An Efficient Interconnect Test Pattern Generation Algorithm for Crosstalk Faults  

Han, Ju-Hee (Department of Computer Science & Engineering, Hanyang University)
Song, Jae-Hoon (Department of Computer Science & Engineering, Hanyang University)
Yi, Hyun-Bean (Department of Computer Science & Engineering, Hanyang University)
Kim, Jin-Kyu (Department of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Department of Computer Science & Engineering, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.44, no.12, 2007 , pp. 71-76 More about this Journal
Abstract
The effect of crosstalk errors is most significant in high-performance circuits. This paper presents effective test patterns for SoC and Board level interconnects considering actual effective aggressors. Initially '6n' algorithm, where 'n' is the total number of interconnect nets, is analyzed to detect and diagnose 100% crosstalk faults. Then, more efficient algorithm is proposed reducing the number of test patterns significantly while maintaining complete crosstalk fault coverage.
Keywords
Crosstalk; Fault Model; Interconnect Test;
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