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An Efficient Diagnosis Algorithm for Multiple Stuck-at Faults  

Lim Yo-Seop (Department of Electrical and Electronic Engineering, Yonsei University)
Lee Joo-Hwan (Department of Electrical and Electronic Engineering, Yonsei University)
Kang Sung-Ho (Department of Electrical and Electronic Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.9, 2006 , pp. 59-63 More about this Journal
Abstract
With the increasing complexity of VLSI devices, more complex faults have appeared. Many methods for diagnosing the single stuck-at fault have been studied. Often multiple defects on a foiling chip better reflect the reality. So, we propose an efficient diagnosis algorithm for multiple stuck-at faults. By using vectorwise intersections as an important metric of diagnosis, the proposed algorithm can diagnose multiple defects using single stuck-at fault simulator. In spite of multiple fault diagnosis, the number of candidate faults is also drastically reduced. For fault identification, positive calculations and negative calculations based on variable weights are used for the matching algorithm. Experimental results for ISCAS85 and full-scan version of ISCAS89 benchmark circuits prove the efficiency of the proposed algorithm.
Keywords
Multiple Stuck-at Faults; Diagnosis; Fault Simulation;
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  • Reference
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