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A Study on Logic Built-In Self-Test Using Modified Pseudo-random Patterns  

Lee Jeong-Min (Department of Computer, Soongsil University)
Chang Hoon (Department of Computer, Soongsil University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.8, 2006 , pp. 27-34 More about this Journal
Abstract
During Built-In Self-Test(BIST), The set of patterns generated by a pseudo-random pattern generator may not provide sufficiently high fault coverage and many patterns were undetected fault. In order to reduce the test time, we can remove useless patterns or change from them to useful patterns. In this paper, we reseed modify the pseudo-random and use an additional bit flag to improve test length and achieve high fault coverage. the fat that a random tset set contains useless patterns, so we present a technique, including both reseeding and bit modifying to remove useless patterns or change from them to useful patterns, and when the patterns change, we choose number of different less bit, leading to very short test length. the technique we present is applicable for single-stuck-at faults. the seeds we use are deterministic so 100% faults coverage can be achieve.
Keywords
LBIST; BIST; reseeding; LFSR;
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  • Reference
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