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Design of PCI/USB Interface Controller with IEEE 1149.1 Test Function  

Kim, Young-Hun (Dept. of Computer Science & Engineering, Hanyang University)
Kim, Ki-Tae (Dept. of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Dept. of Electronical Engineering Computer Science, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.10, 2006 , pp. 54-60 More about this Journal
Abstract
In order to test the board with IEEE 1149.1 boundary scan design, the test sequence must be applied as the bit stream However it is very tedious job to generate the test bit sequence since it requires the complete hlowledge about the 1149.1. This fuper introduces a convenient PCI/USB interface controller, named as Test-Ready PCI (TRPCI) ard Test-Ready USB (TRUSB). Test Bus Controller has been developed by TI and Lucent aiming to generate the test bit stream as an instruction level, thus even the novice test engineer can easily generate the test sequence.
Keywords
IEEE 1149.1; test bus controller; TRUSB; TRPCI;
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