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Design for Self-Repair Systm by Embeded Self-Detection Circuit  

Seo Jung-Il (Dept of Semiconductor Eng., Chungbuk National University)
Seong Nak-Hun (LG.PHILIPS LCD Co.)
Oh Taik-Jin (PIXELPLUS Co.)
Yang Hyun-Mo (Dept of Semiconductor Eng., Chungbuk National University)
Choi Ho-Yong (School of Electrical and Computer Eng. Chungbuk National University)
Publication Information
Abstract
This paper proposes an efficient structure which is able to perform self-detection and self-repair for faults in a digital system by imitating the structure of living beings. The self-repair system is composed of artificial cells, which have homogeneous structures in the two-dimension, and spare cells. An artificial cell is composed of a logic block based on multiplexers, and a genome block, which controls the logic block. The cell is designed using DCVSL (differential cascode voltage switch logic) structure to self-detect faults. If a fault occurs in an artificial cell, it is self-detected by the DCVSL. Then the artificial cells which belong to the column are disabled and reconfigured using both neighbour cells and spare cells to be repaired. A self-repairable 2-bit up/down counter has been fabricated using Hynix $0.35{\mu}m$ technology with $1.14{\times}0.99mm^2$ core area and verified through the circuit simulation and chip test.
Keywords
self-detection; self-repair; artificial cell; spare cell; DCVSL;
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Times Cited By KSCI : 1  (Citation Analysis)
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