An Efficient Test Data Compression/Decompression for Low Power Testing |
Chun Sunghoon
(Department of Electrical and Electronic Engineering, Graduate School, Yonsei University)
Im Jung-Bin (Department of Electrical and Electronic Engineering, Graduate School, Yonsei University) Kim Gun-Bae (Department of Electrical and Electronic Engineering, Graduate School, Yonsei University) An Jin-Ho (Department of Electrical and Electronic Engineering, Graduate School, Yonsei University) Kang Sungho (Department of Electrical and Electronic Engineering, Graduate School, Yonsei University) |
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