1 |
P. G. Ryan and W. K. Fuchs, 'Dynamic Fault Dictionaries and Two-Stage Fault Isolation,' Transactions on IEEE VLSI System, pp. 176-180, 1998
DOI
ScienceOn
|
2 |
B. Chess and T. Larrabeee, 'Creating Small Fault Dictionaries,' Transactions on IEEE Computers-Aided Design, pp. 346-356, 1999
DOI
ScienceOn
|
3 |
V. Boppana, I.Hartanto and W. K. Fuchs, 'Full Fault Dictionary Storage Based on Labeled Tree Encoding,' Transactions on IEEE Computers-Aided Design, pp. 255-268, 1998
|
4 |
I. Pomeranz and S. M. Reddy, 'On the Generation of Small Dictionaries for Fault Location.' Proc. of IEEE Intl. Conf. on Computer Aided Design, pp. 272-279, 1992
DOI
|
5 |
H. Lee, D. Ha, ' Hope: An Efficient Parallel Fault Simulator,' Proc. of Design Automation Conference, pp 336-340, 1992
DOI
|
6 |
I. Pomeranz, S. M. Reddy, ' Fault Diagnosis Based on Parameters of Output Responses,' Proc. of Pacific Rim International Symposium, pp. 139-147, 2000
DOI
|
7 |
V, Boppana and W. K. Fuchs 'Fault Dictionary compaction by Output Sequence Removal,' Proc. of IEEE ACM Intl. Conf. pp. 576-579, 1994
|
8 |
K. Shigeta, T. Ishiyama, 'An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit Extraction,' Proc. of IEEE International Test Conference, pp. 235-244, 2000
DOI
|
9 |
K. Shigata, T. Ishiyama, A Nnew Path Tracing Algorithm with Dynamic Circuit Extraction for Sequential Circuit Fault Diagnosis,' Proc. of VLSI Test Symposium, pp. 48-53, 1998
DOI
|
10 |
A. W. John and L. Eric, 'Failure Diagnosis of Structured VLSI,' Proc. of IEEE Design & Test of Computers, pp. 49 - 60, 1989
DOI
ScienceOn
|
11 |
I. Pomeranz and S.M. Reddy, 'On Dictionary-Based Fault Location in Digital Logic Circuits,' Transactions on IEEE Computers, pp. 48-59, 1997
DOI
ScienceOn
|
12 |
S. Venkataraman, I. Hartanto, W. Kent Fuchs, 'Dynamic Diagnosis of Sequential Circuits Based on Stuck-at Faults,' Proc. of VLSI Test Symposium, pp. 198-203, 1996
DOI
|
13 |
D. B. Lavo and Tracy Larrabee, 'Making Cause-Effect Cost Effective : Low-Resolution Fault Dictionaries,' Proc. of IEEE Intl Test Conf, pp. 278-286, 2001
DOI
|