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An Efficient Test and Diagnosis Algorithm for Dual Port Memories  

김지혜 (삼성전자 반도체 총괄 시스템 LSI 사업부)
김홍식 (LG전자 시스템 IC 사업)
김상욱 (연세대학교 전기전자공학)
강성호 (연세대학교 전기전자공학부)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.5, 2004 , pp. 115-131 More about this Journal
Abstract
As dual port memories are being frequently used, test and diagnosis for dual port memories becomes more important. In this paper, anew diagnosis algerian which can classify faults in detail when the fault is detected during test process is developed. The new algerian increases its efficiency by using the information that can be obtained by test results as well as results using additional diagnostic pattern set. In addition the algorithm can diagnose various fault models for dual port memories.
Keywords
이중 포트 메모리;고장 모델;고장 테스트;고장 진단;
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Times Cited By KSCI : 1  (Citation Analysis)
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