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Operating Conditions Proposal of Bandgap Circuit at Cryogenic Temperature for Signal Processing of Infrared Detector and a Performance Analysis of a Manufactured Chip  

Kim Yon Kyu (Satellite Mission Operation Department, KARI)
Kang Sang-Gu (Department of Electrical Engineering and Computer Science, KAIST)
Lee Hee-Chul (Department of Electrical Engineering and Computer Science, KAIST)
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Abstract
A stable reference voltage generator is necessary to the infrared image signal readout circuit(ROIC) to improve noise characteristics of signal originated from infrared devices, that is, to gain good images. In this paper, bandgap circuit operating at cryogenic temperature of 77K for Infrared image ROIC(readout integrated circuit) was first made. It demonstrates practical use possibility through taking measurements and estimations. Bandgap circuit is a representative voltage reference circuit. Most of bandgap reference circuits which are presented so far operate at room temperature, and their characteristic are not suitable for infrared image ROIC operating at liquid nitrogen temperature, 77K. To design bandgap circuit operating at cryogenic temperature, suitable circuit is selected and the parameter characteristics of used devices as temperature change are seen by a theoretical study and fitted at liquid temperature with considering such characteristics. This circuit has been fabricated in the Hynix 0.6um standard CMOS process, and the output voltage measured shows that the stability is 1.042±0.0015V over the temperature range of 60K to 110K and is better than bandgap circuits operated at room temperature.
Keywords
bandgap reference circuit; cryogenic temperature; temperature coefficient; ROIC;
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