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Novel Model for Nonlinearity of Traveling-Wave Electroabsorption Modulator according to Microwave Characteristics  

윤영설 (중앙대학교 광전자 및 광통신 연구실)
이정훈 (중앙대학교 광전자 및 광통신 연구실)
최영완 (중앙대학교 광전자 및 광통신 연구실)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.40, no.8, 2003 , pp. 580-587 More about this Journal
Abstract
In this paper, we introduce a novel model to analyze the linearity of a TW-EAM (traveling-wave electroabsorption modulator). The device length, microwave loss (ML), and internal reflection (IR) due to impedance mismatch have effect on the linearity of a TW-EAM. The longer devices have characteristics of lower biases with minimum IMDS (intermodulation distortions). ML decreases the output power as well as the IMD value. Internal reflection has different nonlinear characteristics according to the wavelength of the input frequency and the device length. There is little change in SFDR (spurious-free dynamic range) due to ML or IR. As a result, for a 50 GHz band RF-optical communication system, a 0.8 mm-long TW-EAM with the lowest ML would have better properties by using n, which is caused by impedance, mismatch at the output port.
Keywords
Microwave-Photonics; Nonlinearity; Millimeter-wave-Photonic;
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