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A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers
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[
B.I.Dervisoglu
] /
Design Automation Conference
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IEEE Std. 1149.la-1993
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Y. Zorian, E. J. Marinissen, S. Dey, 'Testing Embedded-core-based System Chips', In Proceedings IEEE International Test Conference, pp. 130-143, 1998
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Lee Whetsel, 'An IEEE1149.1 Based Test Access Architecture For ICs With Embedded Cores', Proceedings IEEE International Test Conference, pp. 69-78, 1997
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Erik Jan Marinissen, Hans Dingemanse, Robert Arendsen, Maurice Lousberg, Gerard Bos, Clemens Wouters, 'A Structured and Scalable Mechanism for Test Access to Embedded Reusable Cores', In Proceedings IEEE International Test Conference, pp. 284-293
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V. Iyengar, K. Chakrabarty, E. J. Marinissen, 'Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip', In Proceedings IEEE International Test Conference, pp. 1023-1032, 2001
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Debashis Bhattacharya, 'Instruction-Driven Wake-Up Mechanisms for Snoopy TAP Controller', VLSI Test Symposium, Proceedings, 17th IEEE, pp. 467-472, 1999
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IEEE PI500 Web Site, http://grouper.ieee.org/groups/1500/
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Whetsel, L. 'Addressable test ports an approach to testing embedded cores', In Proceedings IEEE International Test Conference, page 1055-1064, 1999
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Steven F. Oakland, 'Considerations for Implementing IEEE1149.1 on System-on-a-Chip Integrated Circuits', In Proceedings IEEE International Test Conference, page 628-637, 2000
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Debashis Bhattacharya, 'Hierarchical Test Access Architecture for Embedded Cores in an Integrated Circuit', VLSI Test Symposium, Proceedings. 16th IEEE, pp. 8-14, 1998
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B. I. Dervisoglu, 'A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers', Design Automation Conference, pp. 53-58, 2001
DOI
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S. Harrison, G. Noeninckx, P. Horwood and P. Collins, 'Hierachical Boundary-Scan A Scan Chip-Set Solution', In Proceedings IEEE International Test Conference, pp. 480-486, 2001
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