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Test Generation for Multiple Line Affecting Crosstalk Effect  

Lee, Young-Gyun (Department of Computing, Graduate School, Soongsil University)
Yang, Sun-Woong (Department of Computing, Graduate School, Soongsil University)
Kim, Moon-Joon (Department of Computing, Graduate School, Soongsil University)
Chang, Hoon (School of Computing, Soongsil University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.39, no.9, 2002 , pp. 28-36 More about this Journal
Abstract
As cross-coupling capacitance generated in transmission line has been an important issue in VLSI world, a couple of ATPG algorithms has been proposed. However they were studied only for a simple single-line effect problem, so it cost so much time for an unsatisfying test generation efficiency. In this paper, we studied a noise model for multiple affected lines and generated test patterns in a short time. This paper proposes a crosstalk model affected by multiple tranmission lines and implemented an ATPG algorithm for detection of crosstalk noise faults. We modeled the crosstalk noise by multiple transmission line and made a truth table for this. We implemented an ATPG algorithm based on PODEM and revealed the results.
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