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Fault Diagnosis Algorithm for Dual Port Memories  

Park, Han-Won (Dept.of Electric Electronics Engineering, Yonsei University)
Gang, Seong-Ho (Dept.of Electric Electronics Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.39, no.3, 2002 , pp. 20-33 More about this Journal
Abstract
As dual port RAMs are widely used in the various applications, the need for an efficient algorithm to diagnose faults in dual port RAMs is increased. In this paper we propose an efficient algorithm that can diagnose all kinds of faults in dual port RAMs. In addition, the new algorithm can distinguish various fault models and locate the position related to each fault. Using the new algorithm, fault diagnosis for dual port RAMs can be performed efficiently and the performance evaluation with previous approaches proves the efficiency of the new algorithm.
Keywords
dual Port memory; fault model; fault diagnosis;
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