1 |
J.S .Kenny, W. Woo, L. Ding, R. Raich, and T. Zhou "The impact of memory effects on predistortion linearization of RF power amplifier" in 8th Int Microwave and Optical Technology Symp., Montreal, QC, Canada, June 2001, pp.189-193
|
2 |
S. Boumaiza and F. M. Ghannouchi, "Realistic power-amplifiers characterization with application to baseband digital predistortion for 3G base stations," IEEE Trans. Microwave Theory Tech., vol.50, pp.3016-3021, Dec. 2002.
DOI
|
3 |
손길영, 이석희, 방성일 "효율개선을 위한 Gate 제어 Hybrid Doherty 증폭기 구현," 전자공학회논문지, 제42권 TC편, 제3호, 217-224쪽, 2005년 3월
|
4 |
J. H. K. Vuolevi, T. Rahkonen, and J. P. A. Manninen, "Measurement technique for characterizing memory effects in RF power amplifiers, " IEEE Trans. Microwave Theory Tech., col. 49, pp. 1383-1389, Aug. 2001.
DOI
|
5 |
W. Bosch and G. Gatti, "Measurement and simulation of memory effects in predistortion linearizers," IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1885-1890, Dec. 1989.
DOI
|
6 |
Y. Youngoo, Y. Jeahyok, N. Joongjin, K. Bumman, and P. Myungkyu, "Measurement of two-tone transfer characteristics of high-power amplifiers," IEEE Trans. Microwave Theory Tech., vol. 49, pp. 568-571, Mar. 2001.
DOI
|
7 |
고영은, 방성일 "온도보상 기법을 적용한 디지털 방식의 사전 왜곡제거기 알고리듬," 전자공학회논문지, 제42권 TC편, 제9호, 571-580쪽, 2005년 9월
|
8 |
A. Rabany, L. Nguyen, and D. Rice, "Memory effect reduction for LDMOS bias circuits," Microwave J., pp. 124-130, Feb. 2003.
|