1 |
'Integrated circuits - Measurement of electromagnetic emissions 150kHz to 1GHz - Part 6: Measurement of conducted emissions - Magnetic probe method', IEC 61967-6-Ed.1.0, June 2002
|
2 |
T. Harada, N. Masuda and M. Yamaguchi, 'Near field magnetic measurements and their application to EMC of digital equipment', IEICE Trans. Electron., Vol. E89-C, NO.1 Jan. 2006
|
3 |
N. Masuda, N. Tamaki, T. Kuriyama, J. C. Bu, M. Yamaguchi and K. Arai, 'High frequency magnetic near field measurement on LSI chip using planar multi-layer shielded loop coil', IEEE 2003
|
4 |
K. Srinivasan, H. Sasaki, M. Swaminathan and R. Tummala, 'Calibration of near field measurements using microstrip line for noise predictions', Electronic components and technology conference, 2004
|
5 |
David K. Cheng, 'Field and wave electromagnetics 2nd edition', Addison-Wesley, pp. 309-310, 1989
|
6 |
N. Ando, N. Masuda, N. Tamaki, T. Kuriyama, S. Saito, K. Kato, K. Ohashi, M. Saito and M. Yamaguchi 'Miniaturized thin-film magnetic field probe with high spatial resolution for LSI chip measurement' IEEE, pp 357-362
|
7 |
M. Yamaguchi, S. Yabukami, H. Yurugi, K.I. Arai, N Masuda, N. Tamaki and H. Tohya, 'High spatial resolution magnetic field measurements using thin-film shielded loop coil', International conference on solid state devices and materials, pp. 594-595, 1999
|