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Algorithm to cope with SEUs(Single Event Upsets) on STSAT-1 OBC(On-board Computer)  

Chung, Sung-In (Satellite Technology Research Center, KAIST)
Park, Hong-Young (Satellite Technology Research Center, KAIST)
Lee, Heung-Ho (Chung Nam National University)
Publication Information
Abstract
Generally, the satellite circling round in a low orbit goes through Van Allen belt connecting with the magnetic fold, in which electronic components are easily damaged and shortened by charged particles moving in a cycle between the South Pole and the North Pole. In particular, Single Event Upset(SEU) by radiation could cause electronic device on satellite to malfunction. Based on the idea mentioned above, this study considersabout SEU effect on the On-board Computer(OBC) of STSAT-1 in the space environment radiation, and shows algorithm to cope with SEUs. In this experiment, it also is shown that the repetitive memory read/write operation called memory wash is needed to prevent the accumulation of SEUs and the choice for the period of memory wash is examined. In conclusion, it is expected that this research not only contributes to understand low capacity of On-board Computer(OBC) on Low Earth Orbit satellite(LEOS) and SaTReC Technology satellite(STSAT) series, but also makes good use of each module development of Korea Multi-Purpose Satellite(COMPSAT) series.
Keywords
Single Event Upset(SEU); On-board Computer(OBC); STSAT-1; Memory wash;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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