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Analysis of A New Crossbar Embedded Structure for Improved Attenuation Characteristics on the Various Lossy Media  

Kim, Yoon-Suk (Electronics Engineering, Korea Air Force Academy)
Publication Information
Journal of the Institute of Electronics Engineers of Korea TC / v.43, no.12, 2006 , pp. 83-88 More about this Journal
Abstract
In this paper, we propose a new cross bar embedded structure for improvement of attenuation characteristics along the different lossy media. A general characterization procedure based on the extraction of the characteristic impedance and propagation constant for analyzing a single MIS(Metal-Insulator-Semiconductor) transmission line used and an analysis for a new substrate shielding MIS structure consisting of grounded crossbars at the interface between Si and Sio2 layer using the Finite-Difference Time-Domain(FDTD) technique is used. In order to reduce the substrate effects on the transmission line characteristics, a shielding structure consisting of grounded cross bar lines over time-domain signal has been examined. The extracted, distributed frequency-dependent transmission line parameters as well as the line voltages and currents, and also corresponding equivalent circuit parameters have been examined as function of frequency. It is shown that the quality factor of the transmission line can be improved without significant changes in the characteristic impedance and effective dielectric constant.
Keywords
Propagation characteristic; MIS (Metal-Insulator-Semiconductor) line; Grounded cross bar conductor;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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