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A New Fault-Based Built-In Self-Test Scheme for 1.8GHz RF Front-End  

Ryu Jee-Youl (Department of Electrical Engineering, Arizona State University)
Noh Seok-Ho (Major of Electronic Engineering, College of Electronic & Information Engineering, Andong National University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea TC / v.42, no.6, 2005 , pp. 1-8 More about this Journal
Abstract
This paper presents a new low-cost fault-based Built-In Self-Test (BIST) scheme and technique for 1.8GHz RF receiver front end. The technique utilizes input impedance matching measurement. The BIST block and RF receiver front end are designed using 0.25m CMOS technology on a single chip. The technique is simple and inexpensive. The overhead of the BIST circuit is approximately $10\%$ of the total area of the RF front end.
Keywords
RF Front-End; BIST Scheme; input impedance matching;
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