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http://dx.doi.org/10.5370/KIEE.2016.65.3.439

The Study on the SPICE Model Parameter Extraction Method for the Schottky Diode Under DC Forward Bias  

Lee, Un-Gu (Dept. Information & Communication Bucheon Univ.)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.65, no.3, 2016 , pp. 439-444 More about this Journal
Abstract
The method for extracting the SPICE model parameter of Schottky diode under DC forward bias is proposed. A method for improving the accuracy of the SPICE model parameter at various temperatures is proposed. Three analysis steps according to the magnitude of the current is used in order to extract the parameters effectively. At each analysis step, initial parameters are calculated by using the current-voltage equations and the Levenberg-Marquardt analysis is proceeded. To verify the validity of the proposed method, the SPICE model parameters for the BAT45 and FSV1045 under DC forward bias is extracted. Schottky diode currents obtained from the proposed method shows the average relative error of 6.1% and 9% compared with the measured data for the BAT45 and FSV1045 sample at various temperatures.
Keywords
Schottky diode; SPICE model parameter; Levenberg-Marquardt analysis; Parameter extraction;
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