1 |
Seung Bo Shim, In Cheol Song, Ho-Jun Lee, Hae June Lee, J. Appl. Phys., 110(2), pp.23301-9, 2011
DOI
|
2 |
J. P. Boeuf, J. Phys. D 36, R53, 2003
|
3 |
G. V. Samsonov, The Oxide handbook 2nd ed., IFI/Plenum Data, New York, p. 144 and p. 214 (1987)
|
4 |
D. K. Lee, C. S. Park, K. T. Kim, Y. M. Sung, J. Korean Institute of Illuminating and Electrical Installation Engineers Vol. 24, No.2, pp. 106-112 (2010)
DOI
|
5 |
D. K. Lee, D. H. Seo, D. H. Kim, H.-J. Lee and J.-H. Park, p. 157 (2003)
|
6 |
T. Shinoka, Trans. Inst. Electron., Inf. Commun. Eng. C, C-3, 349 (1998)
|
7 |
C. H. Park, D. H. Kim, S. H. Lee and J. H. Ryu, IEEE Trans. On Electron Device 48, 2260 (2001)
DOI
|
8 |
S. J. Kwon, Y. J. Kim, S. E. Lee, Jpn. J. Appl. Phys. 45, 8709 (2006)
DOI
|
9 |
Don-Kyu Lee, Chung-Hoo Park, Hae June Lee, Woo-Sung Choi, Dong-Hyun Kim, and Ho-Jun Lee, J. Appl. L., 89(19), 191501-3, (2006)
DOI
|
10 |
Don-Kyu Lee, Chung-Hoo Park, Hae June Lee, Joon-Young Choi, Dong-Hyun Kim and Ho-Jun Lee, Phy. Plasmas, 14(10), pp.1035051-6, (2007)
|
11 |
J. A. Wang, O. Novaro, X. Bokhimi, T, Lopez, R. Gomez, J. Navarrete, M. E. Llanos, E. Lopez-Salinas, Materials Letters 35, 317, (1998)
DOI
|
12 |
Massaki Tamatani, U. S. Patent (005, 289, 081)
|