Image Processing Based Time-Frequency Domain Reflectometry for Estimating the Fault Location Close to the Applied Signal Point |
Jeong, Jong Min
(Department of Electrical and Electronic Engineering, Yonsei University)
Lee, Chun Ku (Department of Electrical and Electronic Engineering, Yonsei University) Yoon, Tae Sung (Department of Electrical Engineering, Changwon National University) Park, Jin Bae (Department of Electrical and Electronic Engineering, Yonsei University) |
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