Browse > Article
http://dx.doi.org/10.5370/KIEE.2013.62.11.1617

Development of Conductivity Standards for Metals using the van der Pauw Method  

Kang, Jeon-Hong (Division of Physical Metrology, Korea Research Institute of Standards and Science)
Yu, Kwang-Min (Division of Physical Metrology, Korea Research Institute of Standards and Science)
Lee, Sang-Hwa (Division of Physical Metrology, Korea Research Institute of Standards and Science)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.62, no.11, 2013 , pp. 1617-1620 More about this Journal
Abstract
The widely-used measurement methods for conductivity of non-magnetic metals are van der Pauw method, Two Point Probe method and Eddy Current method. Among them a more simpler and easier method is the Eddy Current method and an instrument using the method is a Conductivity Meter which can measure a conductivity by contacting its probe on a sample surface. However, conductivity standards are essentially needed to confirm the meter's performance or to calibrate it. In this study, six kinds of the standards which are made of Cu, Al-1, Al-2, brass, Zn and SUS-316 are developed and conductivity ranges for the standards are 2.27 %IACS ~ 101.6 %IACS with measurement uncertainty of less than 0.3 %.
Keywords
van der Pauw method; Two point probe method; Resistivity; Certified Reference Material; Conductivity ratio; Uncertainty;
Citations & Related Records
연도 인용수 순위
  • Reference
1 A. Jones, "Development of Non-ferrous Conductivity Standards at Boeing", Eddy Current Nondestructive Testing, NBS special publication 589, Jan. 1981.
2 A. Jones, Sr., Eddy-Current Characterization of Materials and Structure, ASTM STP 722, American Society of Testing and Materials, pp. 94-118, 1981.
3 Michael D. Janezic, "DC Conductivity Measurements of Metals", NIST Technical Note 1531, Jan. 2004.
4 van der Pauw, "A method of measuring specific resistivity and Hall effect of discs of arbitrary shape", Philips Res. Rep., Vol. 13, pp.1-9, 1958.
5 Gert Rietveld, DC Conductivity Measurements in the van der Pauw Geometry, IEEE Transactions on Instrumentation and Measurement, Vol. 52. No. 2, April 2003.
6 Patentee: Jeon Hong Kang, Patent No. 10-0653576 : "METAL CONDUCTIVITY MEASUREMENT ELECTRODE AND TEMPERATURE CONTROLLER USING van der Pauw METHOD"
7 Patentee:: Jeon Hong Kang, Patent No. 10-0749388, "APPARATUS FOR MEASURING THE THICKNESS OF PLATE AND CIRCLE TYPE SAMPLE",
8 ISO/IEC GUIDE 98-3:2008, Guide to the expression of uncertainty in measurement (GUM:1995).
9 EA-4/02, "Expression the uncertainty of measurement in calibration", 1999.