1 |
Ahlbin, J., Gadlage, M., Atkinson, N., Narasimham, B., Bhuva, B., Witulski, A., Holman, W. Ea- ton, P. ; Massengill, L., "Effect of Multiple -Transistor Charge Collection on Single-Event Transient Pulse Widths", Device and Materials Reliability, IEEE Transactions on, Issue, 99, pp 1, May, 2011,
|
2 |
Daisuke Kobayashi, Kazuyuki Hirose, Véronique Ferlet-Cavrois, Dale McMorrow, Takahiro Makino, Hirokazu Ikeda, Yasuo Arai, Morifumi Ohno, "Device-Physics-Based Analytical Model for Single-Event Transients in SOI CMOS Logic", NUCLEAR SCIENCE, IEEE Transactions on, Vol. 56, No. 6, pp 3043-3049, December 2009.
DOI
ScienceOn
|
3 |
Larry L., "NUCLEAR EVENT DETECTOR", http://www.freepatentsonline.com/, pp. 2, Aug 1987.
|
4 |
George C Messenger, "The effects of radiation on electronic systems", New York : Van Nostrand Reinhold, cop., 1992.
|
5 |
Lewis Cohn, Manfred Espig, Al Wolicki, Mayrant Simons, Clay Rogers, Alfred Costantine, "Transient Radiation Effects on Electronics(TREE) Handbook", Defence Nuclear Agency, 1996.
|