A Test Vector Reordering for Switching Activity Reduction During Test Operation Considering Fanout |
Lee, Jae-Hoon
(여주대학 게임기획비즈니스과)
Baek, Chul-Ki (성균관대학교 정보통신공학부) Kim, In-Soo (장안대학교 IT학부 인터넷정보통신과) Min, Hyoung-Bok (성균관대학교 정보통신공학부) |
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