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Development of Diagnosis System Adopted Intelligent Smart Junction Box for Improving Vehicular Power Safety  

Jeong, Min-Soo (동해전장 기술연구소)
Kim, Mun-Gyeom (동해전장 기술연구소)
Park, Young-Hoan (동해전장 기술연구소)
Bang, Soon-Young (동해전장 기술연구소)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.57, no.2, 2008 , pp. 276-285 More about this Journal
Abstract
These days the automobile industry, which has rapidly progressed, has been an indispensable part in social and economic activities as well as its research and development have been activated in response to various needs of consumers and markets. The second and third generation control system, getting count on safety and convenience differently than early circuits, cause the hypertrophy of wire harness. The J/Box(Junction Box), which distributes power and wires, was developed to solve the problem. As vehicles have been better in quantity and intelligence, however, environment-friendly electric apparatus system has continuously increased and ITS(Intelligent Transport System) has been introduced in earnest. In result, wires got complicated and multilateral and also there has been a stronger probability that vehicles are out of order due to various problems including mechanical failure. In this study, ISJB(Intelligent Smart Junction Box) was introduced to solve the problem. The diagnosis system was applied to prevent the overload and short of ISJE. Also, the state of vehicles displayed so that drivers monitor it in motion. Likewise error data are saved in the memory so that such data can be analyzed retrospectively. The busbar was adopted in to the main power terminal and the part of power pattern was coverd by lead. Because ISJB is more sensitive to heat in comparison to the busbar type J/Box. With regard the circuits related with safe, alternative circuits were set up in order that electronic devices may be normally operated even when an error arises. ISJB is expected to improve the safety and quality of vehicles.
Keywords
Smart Junction Box; IPS; Thermal; Diagnosis System;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
Times Cited By SCOPUS : 0
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