1 |
R. K .Lenz, R. Y. Tsai, 'Techniques for Calibration of the Scale Factor and Image Center for High Accuracy 3-D Machine Vsion Metrology', IEEE Trans on Pattern Analysis and Machine Intelligence. vol. 10, no. 5, Sep 1988
DOI
ScienceOn
|
2 |
Michael A, Penna, 'Camera Calibration: A Quick and Easy Way to Determine the Scale Factor', IEEE Trans on Pattern Analysis and Machine Intelligence. vol. 13, no. 12, Dec 1991
DOI
ScienceOn
|
3 |
Gang Xu, 쯔지 사부로, 3차원 비젼, 대영사, 2000
|
4 |
Y. Sato, H. Kitagawa and H. Fujita, 'Shape Measurement of Curved Objects Using Multiple Slit-Ray Projections' IEEE Trans. On Pattern Analysis and Machine Intelligence, vol. FAMI-4, no. 6, pp. 641-646, 1982
|
5 |
W. Y. Kim, 'Range Data Analysis using Cross stripe Structured-light System' SPIE Optics, Illumination and Image Sensing for Machine Vision V. vol. 1385, pp. 216-218, 1990
DOI
|
6 |
L. H. Bieman, and M. A. Michniewicz, 'CADEYES - a three dimensional gage', NAECON Proceedings of the IEEE National, vol. 3, pp. 1200-1204, 1992
DOI
|
7 |
C. F .Lin and C .Y .Lin, 'A New approach to high precision 3-D measuring system', Image and Vision Computing. vol.17, pp. 805-814, 1999
DOI
ScienceOn
|
8 |
I. K. Park and S. U. Lee, 'Geometric modeling from scattered 3-D range data', Image Processing. vol. 2, pp. 712-715, 1997
DOI
|
9 |
J. Chen, D. Yang and H. Zhou, 'Avoiding Spurious Reflections form Shiny Surfaces On a 3D Real-Time Machine Vision Inspection System', IMTC/98 Conference Proceedings, vol. 1, pp. 364-368, 1998
|