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[
홍성제;박은세
] /
테스팅 및 테스팅을 고려한 설계
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2 |
Alexander Miczo, 'Digital Logic Testing and Simulation', John Wiley & Sons, 1986
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Eichelberger, E. B., T. W. Williams, 'A Logic Design Structure for LSI Testability', Proc.14th Design Automation Conf., pp. 462-468, June 1977
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Carter, W. C. et al., 'Design of Serviceability Features for the IBM system/360', IBM J. Res. Dev., Vol. 8, pp. 115-126, April 1964
DOI
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5 |
Williams, M. J. Y., and J. B. Angell, 'Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic', IEEE Trans. Comput., Vol. C-22, No. 1, pp. 46-60, January 1973
DOI
ScienceOn
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6 |
M. S. Abadir, M. A. Breuer, 'A Knowledge Based System for Designing Testable VLSI Chips', IEEE Design & Test of Computers, Vol. 2, No. 4, pp. 56-68, August 1985
DOI
ScienceOn
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7 |
'Synopsys manual-Synopsys DFT Compiler Scan Synthesis User Guide chapter 9', Synopsys, pp. 8-11, 2000
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8 |
홍성제, 박은세, '테스팅 및 테스팅을 고려한 설계', 흥릉과학출판사, , 1998
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9 |
M. Abramovici, M. A. Breuer and D. Friedman, Digital Systems Testing and Testable Design, Computer Science Press, 1990
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10 |
'SynTest User's Guide chapter 6 (Using Pyramid-Test Logic Synthesis and Verification Tools)', SynTest, pp. 31-32, 1998
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11 |
Maling, K., and E.L. Allen, 'A Computer Organization and Programming system for Automated Maintenance', IEEE Trans. Electron Comput., Vol. EC-12, pp. 887-895, December 1963
DOI
ScienceOn
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