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A Image Reconstruction Uing Simulated Annealing in Electrical Impedance Tomograghy  

Kim Ho-Chan (제주대 공대 전기전자공학부)
Boo Chang-Jin (제주대 공대 전기전자공학부)
Lee Yoon-Joon (제주대 공대 에너지공학과)
Publication Information
The Transactions of the Korean Institute of Electrical Engineers D / v.52, no.2, 2003 , pp. 120-127 More about this Journal
Abstract
In electrical impedance tomography(EIT), various image reconstruction algorithms have been used in order to compute the internal resistivity distribution of the unknown object with its electric potential data at the boundary. Mathematically the EIT image reconstruction algorithm is a nonlinear ill-posed inverse problem. This paper presents a simulated annealing technique as a statistical reconstruction algorithm for the solution of the static EIT inverse problem. Computer simulations with the 32 channels synthetic data show that the spatial resolution of reconstructed images by the proposed scheme is improved as compared to that of the mNR algorithm or genetic algorithm at the expense of increased computational burden.
Keywords
Electrical impedance tomography; Simulated annealing; Inverse problem; Finite element method;
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