1 |
Can Wang, 'Dielectric properties of multilayered thin films prepared by rf magnetron sputtering', Appl. Phys. Lett., Vol. 82 No. 17, pp.2880-2882, 2003
DOI
ScienceOn
|
2 |
M. Azuma et al., 'Electrical characteristics of High Dielectric Constant Materials for Integrated Ferro-electrics', Proc. 4th ISIF, pp. 109-117, 1992
|
3 |
L. Baginsky and E. G. Kostov, 'Information Writing Mechanism in Thin Films MFIS-Structures, Ferro-electrics', Vol. 143, pp. 239-250, 1993
|
4 |
Yoichi Miyasaka, 'High Dielectric Thin Films for ULSI DRAM Application', Extended Abstracts of 1995 International Conference on Solid State Device and Materials, Osaka, pp. 506-508, 1995
|
5 |
Weiguo Liu, Jong Soo Ko and Weiguang Zhu, 'Preparation and porperties of multilayer thin films for pyroelectric application', Thin Solid Films, Vol. 371, Issues 1-2, pp. 254-258, 2000
DOI
ScienceOn
|
6 |
I. Kanno, S. Hayashi, R. Takayama, H. Sakakima and T. Hirao, 'Prossing and characterization of ferroelectric thin films by multi-ion-beam sputtering', Nuclear Instruments and Methods in Physics Research Section B, Vol 112, Issues 1-4, pp. 125-128, 1996
DOI
ScienceOn
|
7 |
Hedekazu Doi, Tsutomu Atsukil, 'Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Thin Films', Jpn. J. Appl. Phys. Vol.34, pp. 5105-5112, 1995
DOI
|
8 |
Katsuhiro Aoki, Yukio Fukuda, Ken Numata and Akitoshi Bishimura, 'Electrode Dependences of Switching Endurance Properties of Lead-Zirconate-Titanate Thin-Film Capacitors', Jpn. j. Appl. Phys. Vol. 35, pp. 2210-2215, 1996
DOI
|
9 |
L. Li and X. M. Chen, 'Ferroelectric/antiferroelectric layered ceramics in system', Materials Science and Engineering B, Vol. 108, Issue 3, pp. 200-205, 2004
DOI
|
10 |
F. Le Marrec, R. Farhi, B. Dkhil, J. Chevreul and M. G. Karkuta, 'Absence of a PbTiO3 phase transition in superlattices', Journal of the European Ceramic society, Vol. 21, Issues 10-11, pp. 1615-1618, 2000
DOI
|
11 |
Newnham, R. E., 'Ferroelectric Materials and Their Applications By Ynhuan Xu', J. A. Chem. Soc., Vol. 115 No.23, pp. 11061, 1993
|