1 |
L.L.Maissel and R.Glang, Handbook of Thin Film Technology, Chap. 5, (1970), p. 5
|
2 |
T.Suzuki, Y.Manita, T.Yamazaki, S.Wada and Namba, J.Mater.Sci., Vol. 30, (1995), p. 2067
DOI
|
3 |
H.Wang, M.R.Shen, Z.Y.Ning, C.Ye, C.B.Cao, H.Y.Dang and H.S.Zhu, Appl.Phys. Lett., Vol. 69, (1996) p. 1074
DOI
ScienceOn
|
4 |
Y.Bounouh, M.L.Teye, A.Dehbi-Alaoui, and A.Matthews, Phys. Rev. Vol. B51, (1994) p.9597
DOI
ScienceOn
|
5 |
Q.Zhang, S.F.Yoon, J.Ahn, and H.Yang, J.Appl.Phys., Vol.76, (1994) p.3823
DOI
|
6 |
F.Tuinstra and W.C.Vassell, J.Appl.Phys., Vol.53 (1970) p.1126
|
7 |
R.O.Dillon, J.A.Woollam and V.Katkanant, Phys. Rev., Vol. B29 (1984) p.3482
DOI
|
8 |
J.R.Ristein, R.T.Stief and L.Ley, J.Appl, Phys., Vol.84 (1998) p.3836
DOI
ScienceOn
|
9 |
B.Dishler, A. Bubenzer, and P.Koidj., Solid State Commum, Vol.48 (1983) p. 636
|