1 |
B. Jayant Baliga, Power semiconductor devices, PWS Publishing Company, pp. 81-113, 1995
|
2 |
Michael S. Adler, et al, 'Theory and breakdown voltage for planar device with a single field limiting ring', IEEE Transactions on Electron Devices, Vol. ED-24, No. 2, February 1977
|
3 |
MEDICI Version 4.1 User's Manual, Avanti
|
4 |
V. Macary, et al., Comparison between biased and floating guard rings used as junction termination technique, ISPSD'92, pp. 230-233, 1992
|
5 |
Chanho Park, et al., A new junction termination technique using ICP RIE for ideal breakdown voltages, ISPSD'02, pp. 257-260, 2002
DOI
|