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Lifetime-Temperature Rise Model for the Evaluation of Degradation in Electric Connections/Contacts  

Kim, Jeong-Tae (대진대 전기공학과)
Kim, Nam-Jun (대진대 전기공학과)
Publication Information
The Transactions of the Korean Institute of Electrical Engineers C / v.51, no.2, 2002 , pp. 55-61 More about this Journal
Abstract
In this paper, 'lifetime-temperature rise model' based on the 'lifetime-resistance model' is theoretically Proposed, in order to find out the evaluation method of degradation and the residual lifetime by use of infrared image camera for electric connections/contacts. Two assumptions have been builded up for the 'lifetime-temperature rise model': one is associated with the linear relationship between the temperature ism ΔK and contact resistance, and the other the functional relationship between the temperature of electric connections/contacts and the operating time presenting in the 'lifetime-resistance model'. To prove the proposed model, experiments have been performed for various electric connections/contacts. From the experimental results, measured values were quite similar to the calculated values, which proved the above-mentioned two assumptions. Therefore, by use of 'lifetime-temperature rise model', it is possible to estimate the trend of degradation and the residual lifetime for electric connections/contacts through the temperature measurements .
Keywords
electric connections/contacts; lifetime; temperature-rise; contact resistance; thermal image camera;
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  • Reference
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