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http://dx.doi.org/10.3795/KSME-B.2013.37.9.823

Measurement of Bow in Silicon Solar Cell Using 3D Image Scanner  

Yoon, Phil Young (Dept. of Mechanical Engineering, Hongik Univ.)
Baek, Tae Hyeon (Dept. of Electrical Engineering, Chungbuk Univ.)
Song, Hee Eun (Korea Institute of Energy Research)
Chung, Haseung (Dept. of Mechanical and System Design Engineering, Hongik Univ.)
Shin, Seungwon (Dept. of Mechanical and System Design Engineering, Hongik Univ.)
Publication Information
Transactions of the Korean Society of Mechanical Engineers B / v.37, no.9, 2013 , pp. 823-828 More about this Journal
Abstract
To reduce the cost per watt of photovoltaic power, it is important to reduce the cell thickness of crystalline silicon solar cells. As the thickness of the silicon layer is reduced, two distinctive thermal expansion rates between the silicon and the aluminum layer induce bowing in a solar cell. With a thinner silicon layer, the bowing distance grows exponentially. Excessive bowing could damage the silicon wafer. In this study, we tried to measure an irregularly curved silicon solar cell more accurately using a 3D image scanner. For the detailed analysis of the three-dimensional bowing shape, a least square fit was applied to the point data from the scanned image. It has been found that the bowing distance and shape distortion increase with a decrease in the thickness of the silicon layer. An Ag strip on top of the silicon layer can reduce the bowing distance.
Keywords
Silicon Solar Cell; Bow Phenomenon; Thermal Expansion Rate; 3D Image Scanner; Data regression;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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