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http://dx.doi.org/10.3795/KSME-A.2017.41.8.745

Tension Tests of Copper Thin Films  

Park, Kyung Jo (Division of Mechanical Design Engineering, Chonnam Nat'l Univ.)
Kim, Chung Youb (Division of Mechanical Design Engineering, Chonnam Nat'l Univ.)
Publication Information
Transactions of the Korean Society of Mechanical Engineers A / v.41, no.8, 2017 , pp. 745-750 More about this Journal
Abstract
Tension tests for copper thin films with thickness of $12{\mu}m$ were performed by using a digital image correlation method based on consecutive digital images. When calculating deformation using digital image correlation, a large deformation causes errors in the calculated result. In this study, the calculation procedure was improved to reduce the error, so that the full field deformation and the strain of the specimen could be accurately and directly measured on its surface. From the calculated result, it can be seen that the strain distribution is not uniform and its variation is severe, unlike the distribution in a common bulk specimen. This might result from the surface roughness introduced in the films during the fabrication process by electro-deposition.
Keywords
Tension Test; Copper Thin Films; Digital Image Correlation(DIC); Large Deformation;
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Times Cited By KSCI : 2  (Citation Analysis)
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