Reliability Demonstration Test Method for Electromagnetic Shielding Doorset with a Sub-Unit Subjected to Preventive Replacement |
Shin, Jung-Hun
(Daegu-Gyeongbuk Medical Innovation Foundation)
Lee, Hyo-Kyung (Dae Han Shield Engineering Co., Ltd.) Jang, Jin (Korea Institute of Machinery & Materials) Kim, Do-Sik (Korea Institute of Machinery & Materials) Nam, Tae-Yeon (Korea Institute of Machinery & Materials) Jung, Dong-Soo (Korea Institute of Machinery & Materials) |
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