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http://dx.doi.org/10.3795/KSME-A.2012.36.2.173

Matching Technology Between Nip Roll Characteristics and Quality of Print Pattern in Roll-to-Roll Printed Electronics Systems  

Choi, Jea-Won (Department of Mechanical Engineering, Konkuk Univ.)
Shin, Kee-Hyun (Department of Mechanical Engineering, Konkuk Univ.)
Lee, Chang-Woo (Research Center, Toba Co.)
Publication Information
Transactions of the Korean Society of Mechanical Engineers A / v.36, no.2, 2012 , pp. 173-178 More about this Journal
Abstract
Currently, active research is being performed on printing of electronic devices such as RFID devices, flexible displays, solar cells, and e-paper. This technique has several advantages over existing technologies such as lithography and etching. In particular, RFID devices, flexible displays, solar cells, and e-paper require flexibility and a mass production system. Thus, attention is being focused on the roll-to-roll process. High quality should be guaranteed in the roll-to-roll printed electronics systems, and good thickness and roughness qualities must be ensured. Experimental design was applied to this problem to analyze the main effects and interaction effects of various factors. Matching technology between the nip roll characteristics and the quality of the print pattern in roll-to-roll printed electronics systems was proposed to improve the printing quality.
Keywords
Roll to Roll Printed Electronics System; Nip Roll; Matching Technology; DOE;
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  • Reference
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