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http://dx.doi.org/10.9708/jksci.2015.20.1.197

A Metrics Set for Measuring Software Module Severity  

Hong, Euy-Seok (School of Information Technology, Sungshin Women's University)
Abstract
Defect severity that is a measure of the impact caused by the defect plays an important role in software quality activities because not all software defects are equal. Earlier studies have concentrated on defining defect severity levels, but there have almost never been trials of measuring module severity. In this paper, first, we define a defect severity metric in the form of an exponential function using the characteristics that defect severity values increase much faster than severity levels. Then we define a new metrics set for software module severity using the number of defects in a module and their defect severity metric values. In order to show the applicability of the proposed metrics, we performed an analytical validation using Weyuker's properties and experimental validation using NASA open data sets. The results show that ms is very useful for measuring the module severity and msd can be used to compare different systems in terms of module severity.
Keywords
defect severity; module severity; software metrics; metrics validation;
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Times Cited By KSCI : 1  (Citation Analysis)
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