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http://dx.doi.org/10.9708/jksci.2014.19.12.031

Applying tilt mechanism for high-resolution image acquisition  

Song, Chun-Ho (Samsung Thales)
Abstract
In this paper, to compensate the degraded performance in high-resolution infrared sensor due to assembling error, the influence of each component was evaluated through the sensitivity analysis of lens assembly, axis mirror, and detector and also suggested detector tilt mechanism for compensation. 3 detector tilt mechanisms were investigated. The first one is 'Shim plate' method which is applying shim on installing plane. The second one is 'Tilting screw' method that is using tilt screw for adjusting detection plane. The last one is 'Micrometer head' method that is installing micrometer on detection plane and acquiring quantitative data. Based on the investigation result, 'Tilting screw' method was applied due to ease of user control, small volume, and real-time controllability, thereby we could acquire high-resolution infrared images. The research result shows that the tilting mechanism is necessary technology for the implementation of high-resolution infrared imaging system.
Keywords
Thermal Image system; Tilt mechanism; sensitivity analysis;
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