Measurement reliability of irreversible stress/strain limits in Sn-Cu double layer stabilized IBAD/RCE-DR processed GdBCO coated conductor tapes under uniaxial tension at 77 K |
Bautista, Zhierwinjay
(Andong National University)
Diaz, Mark Angelo (Andong National University) Shin, Hyung-Seop (Andong National University) Lee, Jae-Hun (SuNAM Co Ltd.) |
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