Non-invasive Measurements of the Thickness of YBCO Thin Films by Using Microwave Resonators: Roles of the Uncertainty in the Calibration Film Thickness |
Kim, Myung-Su
(Department of Physics and Center for Wireless Transmission Technology, Konkuk University)
Jung, Ho-Sang (Department of Physics and Center for Wireless Transmission Technology, Konkuk University) Yang, Woo-Il (Department of Physics and Center for Wireless Transmission Technology, Konkuk University) Lee, Sang-Young (Department of Physics and Center for Wireless Transmission Technology, Konkuk University) |
1 | N. Klein et al., J. Appl. Phys. 67, 6940 (1990). |
2 | J. H. Lee, W. I. Yang, M. J. Kim, J. C. Booth, K. Leong, S. Schima, D. Rudman and S. Y. Lee, IEEE Trans. Appl. Supercond. 15, 3700 (2005). |
3 | See IEC 61788-15 Ed.1: Superconductivity - Part 7: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies. |
4 | See, e.g., M. Hein, High-temperature Superconductor Thin Films at Microwave Frequencies, STMP 155 (Springer-Verlag, Berlin, 1999), Chap. 2, and the related references therein. |
5 | B. A. Willemsen, IEEE Trans. Appl. Supercond. 11, 60 (2001). |
6 | S. Y. Lee and B. Oh B, "Recent progress in microwave HTS technology in Korea and Japan", J. Supercond. 16 823-831 (2003). |
7 | R. Jenkins, X-Ray Fluorescence Spectrometry (John Wiley & Sons, New York, 1983), p. 51. |
8 | M. J. Banet, M. Fuchs, J. A. Rogers, J. H. Reinold, Jr., J. M. Knecht, M. Rothschild, R. Logan, A. A. Maznev, and K. A. Nelson, Appl. Phys. Lett. 73, 169 (1998). |
9 | S. Y. Lee, J. H. Lee, and H. S. Jung, J. Korean Phys. Soc. 54(4), 1619 (2009). |
10 | H. S. Jung, W. I. Yang, J. H. Lee, J. M. Sohn, K. N. Choo, B. G. Kim, and S. Y. Lee, Chin. Phys. Lett. 27(8), 087405 (2010). |
11 | J. H. Lee, M. S. Kim, H. K. Han, H. S. Jung, W. I. Yang, S. Y. Lee, B. Park, and S.-G. Lee, J. Korean Phys. Soc. 60(7), 1072 (2012). |
12 | J. H. Lee, H. K. Han, and S. Y. Lee, "Effects of a Temperature-dependent Dielectric Constant on the Geometrical Factors of Dielectric Resonators and on the Measurement Accuracy for the Surface Resistance of Superconductor Films", J. Korean Phys. Soc. 47, 494-500 (2005). |
13 | J. Mazierska, "Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications", J. Supercond. 10, 73 (1997). |
14 | S. Ohshima, Physica C 412-414, 1506 (2004). |