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Non-invasive Measurements of the Thickness of YBCO Thin Films by Using Microwave Resonators: Roles of the Uncertainty in the Calibration Film Thickness  

Kim, Myung-Su (Department of Physics and Center for Wireless Transmission Technology, Konkuk University)
Jung, Ho-Sang (Department of Physics and Center for Wireless Transmission Technology, Konkuk University)
Yang, Woo-Il (Department of Physics and Center for Wireless Transmission Technology, Konkuk University)
Lee, Sang-Young (Department of Physics and Center for Wireless Transmission Technology, Konkuk University)
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Abstract
Microwave metrology for the thickness of metallic or superconductive films provides a new way to measure the film thickness in a non-invasive way by using microwave resonators, with the measurement accuracy affected by standard uncertainties in the resonator quality factor, temperature-dependent resonant frequency and the dimensions of the resonators. Here we study effects of the standard uncertainty in the thickness, $t_{cal}$, of a calibration $YBa_2Cu_3O_{7-{\delta}}$ (YBCO) film on the measured thicknesses, $t_{RF}$, by using a ~ 40 GHz microwave resonator. For the study, we used five YBCO films having the thicknesses of 70 - 360 nm, for which relative standard uncertainties in $t_{RF}$ due to that in $t_{cal}$ are obtained. The standard uncertainty in $t_{cal}$ was determined with the surface roughness of the film taken into account. It appeared that relative standard uncertainty in $t_{cal}$ significantly affects the $t_{RF}$ values, with the values of 1% (5%) in the former resulting in those of 1-2% (5-9%) for the latter at 10 K. Our results show that, for realizing relative standard uncertainties less than 5% in $t_{RF}$ for all the YBCO films, the surface roughness of the calibration films should be small enough to realize a relative standard uncertainty of less than 2.7% in $t_{cal}$.
Keywords
Film thickness; uncertainty; microwave; dielectric resonator; surface resistance;
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  • Reference
1 N. Klein et al., J. Appl. Phys. 67, 6940 (1990).
2 J. H. Lee, W. I. Yang, M. J. Kim, J. C. Booth, K. Leong, S. Schima, D. Rudman and S. Y. Lee, IEEE Trans. Appl. Supercond. 15, 3700 (2005).
3 See IEC 61788-15 Ed.1: Superconductivity - Part 7: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies.
4 See, e.g., M. Hein, High-temperature Superconductor Thin Films at Microwave Frequencies, STMP 155 (Springer-Verlag, Berlin, 1999), Chap. 2, and the related references therein.
5 B. A. Willemsen, IEEE Trans. Appl. Supercond. 11, 60 (2001).
6 S. Y. Lee and B. Oh B, "Recent progress in microwave HTS technology in Korea and Japan", J. Supercond. 16 823-831 (2003).
7 R. Jenkins, X-Ray Fluorescence Spectrometry (John Wiley & Sons, New York, 1983), p. 51.
8 M. J. Banet, M. Fuchs, J. A. Rogers, J. H. Reinold, Jr., J. M. Knecht, M. Rothschild, R. Logan, A. A. Maznev, and K. A. Nelson, Appl. Phys. Lett. 73, 169 (1998).
9 S. Y. Lee, J. H. Lee, and H. S. Jung, J. Korean Phys. Soc. 54(4), 1619 (2009).
10 H. S. Jung, W. I. Yang, J. H. Lee, J. M. Sohn, K. N. Choo, B. G. Kim, and S. Y. Lee, Chin. Phys. Lett. 27(8), 087405 (2010).
11 J. H. Lee, M. S. Kim, H. K. Han, H. S. Jung, W. I. Yang, S. Y. Lee, B. Park, and S.-G. Lee, J. Korean Phys. Soc. 60(7), 1072 (2012).
12 J. H. Lee, H. K. Han, and S. Y. Lee, "Effects of a Temperature-dependent Dielectric Constant on the Geometrical Factors of Dielectric Resonators and on the Measurement Accuracy for the Surface Resistance of Superconductor Films", J. Korean Phys. Soc. 47, 494-500 (2005).
13 J. Mazierska, "Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications", J. Supercond. 10, 73 (1997).
14 S. Ohshima, Physica C 412-414, 1506 (2004).