Detection of the Defected Regions in Manufacturing Process Data using DBSCAN |
Choi, Eun-Suk
(충북대학교 컴퓨터과학)
Kim, Jeong-Hun (충북대학교 컴퓨터과학) Nasridinov, Aziz (충북대학교 컴퓨터과학) Lee, Sang-Hyun ((주)유라) Kang, Jeong-Tae ((주)유라) Yoo, Kwan-Hee (충북대학교 컴퓨터과학) |
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