SIFT Image Feature Extraction based on Deep Learning |
Lee, Jae-Eun
(Department of Electronic Materials Engineering, Kwangwoon University)
Moon, Won-Jun (Department of Electronic Materials Engineering, Kwangwoon University) Seo, Young-Ho (Department of Electronic Materials Engineering, Kwangwoon University) Kim, Dong-Wook (Department of Electronic Materials Engineering, Kwangwoon University) |
1 | C. Harris, M. Stephens, "A combined corner and edge detector," Proceedings of the Alvey Vision Conference, pp.147-151, 1988. |
2 | K. Mikolajczyk, C. Schmid, "Indexing based on scale invariant interest points," ICCV, Vol.1, pp. 525-531, 2001. |
3 | J. Shi, C. Tomasi, "Good features to track," 9th IEEE Conference on Computer Vision and Pattern Recognition, Springer, Heidelberg, 1994. |
4 | D. G. Lowe, "Distinctive Image Features from Scale-Invariant Keypoints," International Journal of Computer Vision, Vol.60, No.2, pp.91-110, 2004. DOI |
5 | H. Bay, T. Tuytelaars, and L. Van Gool, "Surf: Speeded up robust features," In European Conference on Computer Vision, Vol.1, No.2, May 2006. |
6 | E. Rosten, T. Drummond, "Machine learning for high-speed corner detection," Proc. 9th European Conference on Computer Vision (ECCV'06), May 2006. |
7 | E. Mair, G. Hager, D. Burschka, M. Suppa, and G. Hirzinger, "Adaptive and generic corner detection based on the accelerated segment test," Computer Vision-ECCV 2010, Vol.2, No.2, pp.183-196, 2010. |
8 | M. WonJun, S. Youngho, and K. Dongwook, "Parameter Analysis for Time Reduction in Extracting SIFT Keypoints in the Aspect of Image Stitching," Journal of Broadcast Engineering, Vol.23, No.4, pp.559-573, July 2018. DOI |
9 | E. Rublee, V. Rabaud, K. Konolige, and G. Bradski, "ORB: an efficient alternative to SIFT or SURF," In Proc. of the IEEE Intl. Conf. on Computer Vision (ICCV), Vol.13, 2011. |
10 | E. Agustsson, R. Timofte, "NTIRE 2017 Challenge on Single Image Super-Resolution: Dataset and Study," In The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, 2017. |
11 | R. Hess, "An Open-Source SIFT Library," ACM Multimedia, pp.1493-1496, 2010. |
12 | K. Simonyan, A. Zisserman, "Very deep convolutional networks for large-scale image recognition," In Proc. International Conference on Learning Representations (ICLR), 2015. |
13 | K. Mikolajczyk, C. Schmid, "Scale and affine invariant interest point detectors," IJCV, Vol.1, No.60, pp.63-86, 2004. DOI |